Measurement of Optical Nonlinear Response in Silicon Wire Waveguides by Frequency-Resolved Optical Gating

Satoshi Suda, Ken Tanizawa, Hitoshi Kawashima, Shu Namiki, Toshifumi Hasama, and Hiroshi Ishikawa

Technical Digest of The 17th OptoElectronics and Communications Conference (OECC 2012)

6E2-1

2012/06

有

無

英語

海外

研究論文（国際会議プロシーディングス）

共著（筆頭者以外）