Patents
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Basic information
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| Name | NAKAHIRA Kenji |
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| researchmap researcher code | 7000019192 |
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Patent Right
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荷電粒子顕微鏡装置及びこれを用いた試料の検査方法
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特許第05380230号
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2013/10
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中平健治, 宮本敦
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