Patents

Basic information

Name NAKAHIRA Kenji
Belonging department
Occupation name
researchmap researcher code 7000019192
researchmap agency

Industrial Property Right Type

Patent Right

Name

光検査方法及びその装置

Author

中平健治, 本田敏文, 中田俊彦

ApplicationID

-

ApplicationDate

PublicID

PublicDate

TranslationID

TranslationDate

PatentID

特許第05537488号

Date of registration

Date of issue

2014/05

URL

Format

OrganizationCd

ApplicationPerson

Right Holder

Applicant Country

Acquisition Country

J-GLOBAL ID

Summary

Note