Patents

Basic information

Name NAKAHIRA Kenji
Belonging department
Occupation name
researchmap researcher code 7000019192
researchmap agency

Industrial Property Right Type

Patent Right

Name

走査型荷電粒子顕微鏡装置および走査型荷電粒子顕微鏡装置で取得した画像の処理方法

Author

中平健治, 本田敏文, 宮本敦

ApplicationID

-

ApplicationDate

PublicID

PublicDate

TranslationID

TranslationDate

PatentID

US-P8106357

Date of registration

Date of issue

2012/01

URL

Format

OrganizationCd

ApplicationPerson

Right Holder

Applicant Country

Acquisition Country

J-GLOBAL ID

Summary

Note