Measurement of Optical Nonlinear Response in Silicon Wire Waveguides by Frequency-Resolved Optical Gating
Satoshi Suda, Ken Tanizawa, Hitoshi Kawashima, Shu Namiki, Toshifumi Hasama, and Hiroshi Ishikawa
Technical Digest of The 17th OptoElectronics and Communications Conference (OECC 2012)
6E2-1