Patents
|
|
Basic information
|
| Name | NAKAHIRA Kenji |
| Belonging department | |
| Occupation name | |
| researchmap researcher code | 7000019192 |
| researchmap agency |
 |
Patent Right
|
欠陥観察方法及び欠陥観察装置
|
嶺川陽平, 中垣亮, 中平健治, 平井大博, 北橋勝弘
|
-
|
|
|
|
|
|
特許第05452392号
|
|
2014/01
|
|
|
|
|
|
|
|
|